Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces∗
نویسندگان
چکیده
The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations. Submitted to Journal of Applied Physics Sharp Reduction of the Secondary Electron Emission Yield from Grooved Surfaces M. T. F. Pivi ∗ F. K. King, R. E. Kirby, T. O. Raubenheimer, G. Stupakov Stanford Linear Accelerator Center, 2575 Sand Hill Road, Menlo Park CA-94025, USA F. Le Pimpec Paul Scherrer Institute 5232 Villigen Switzerland Abstract The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.The effect of an artificially-enhanced rough surface on the secondary electron emission yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with Monte-Carlo simulations.
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Experimental Studies on Grooved Surfaces to Suppress Secondary Electron Emission
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